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Reference Terms
from Wikipedia, the free encyclopedia

Transmission electron microscopy

Transmission electron microscopy (TEM) is an imaging technique whereby a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film, or to be detected by a CCD camera.

Note:   The above text is excerpted from the Wikipedia article "Transmission electron microscopy", which has been released under the GNU Free Documentation License.
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